## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
Sample preparation technique for transmission electron microscopy of thin films on sapphire
β Scribed by Summerville, M. K. ;Posthill, J. B.
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1989
- Tongue
- English
- Weight
- 195 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0741-0581
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β¦ Synopsis
Minimete is a registered trademark of Buehler Ltd. Other matwials used were Metadi" diamond paste and Texmete material from Buehler.
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