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Rutherford backscattering spectrometry of real CdTe surfaces

โœ Scribed by E Perillo; G Spadaccini; M Vigilante; M Savastano; AM Mancini; A Quirini; L Vasanelli; R Giorgi

Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
265 KB
Volume
39
Category
Article
ISSN
0042-207X

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โœ K.P. O'Donnell; M.E. White; S. Pereira; M.F. Wu; A. Vantomme; W. Van Der Stricht ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 138 KB

An experimental technique that provides an accurate measure of composition is necessary if we wish to ascertain the effect of indium content on the optical and structural characteristics of InGaN epilayers. Here we compare measurements by photoluminescence (PL) and Rutherford Backscattering Spectrom