Room temperature operated single electron transistor fabricated by electron beam nanolithography
β Scribed by K. Kurihara; H. Namatsu; M. Nagase; T. Makino
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 305 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0167-9317
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β¦ Synopsis
We have fabricated a Si-based single electron transistor (SET) with precisely controlled structure using a newly developed electron beam nanolithography system and a Si nanofabrication process. A Si island and tunnel barriers are fabricated by trench etching with reactive ion etching on a superficial Si layer of SIMOX substrate, combined with an image reversal technique using ECR plasma oxidation. The SET fabricated with this method accommodates a 10-nm Si island and achieved room temperature operation.
π SIMILAR VOLUMES
In this work, we propose a fabrication process for a single-electron transistor on silicon. The process is developed on silicon on insulator wafer and it is based on electron beam lithography and KOH anisotropic etching. A structure composed by a small silicon isle connected to the leads by channels