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Room temperature electroluminescence of Er-implanted silicon diodes grown by MBE

✍ Scribed by M. Jaumann; J. Stimmer; P. Schittenhelm; J.F. Nützel; G. Abstreiter; E. Neufeld; B. Holländer; Ch. Buchal


Book ID
103619222
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
271 KB
Volume
102
Category
Article
ISSN
0169-4332

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Effect of the breakdown nature on Er-rel
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The influence of the p-n junction breakdown mechanism on the Er 3+ electroluminescence (EL) intensity and excitation efficiency (an intra 4f transition 4 I 13/2 → 4 I 15/2 of Er 3+ ion at the wavelength of 1.54 m) has been investigated in Si:Er light emitting diodes (LED) grown with sublimation mole