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Resistive switching characteristics of thin NiO film based flexible nonvolatile memory devices

✍ Scribed by Hongjun Wang; Changwei Zou; Lin Zhou; Canxin Tian; Dejun Fu

Book ID: 113797859
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 359 KB
Volume: 91
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2011.05.037

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