Thickness dependence of the resistive switching behavior of nonvolatile memory device structures based on undoped ZnO films

✍ Scribed by Youn Hee Kang; Ji-Hyuk Choi; Tae Il Lee; Woong Lee; Jae-Min Myoung

• Book ID: 113915555
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 573 KB
• Volume: 151
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/j.ssc.2011.08.036