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Reliability study on rapid thermal processed metal-oxide-semiconductor field effect transistors

✍ Scribed by S.K. Lee; Y.H. Ku; D.L. Kwong; C.-O. Lee

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 325 KB
Volume: 31
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(88)90024-x

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