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Reliability issues of Gallium Nitride High Electron Mobility Transistors

✍ Scribed by Meneghesso, Gaudenzio; Meneghini, Matteo; Tazzoli, Augusto; Ronchi, Nicolo'; Stocco, Antonio; Chini, Alessandro; Zanoni, Enrico

Book ID: 111913543
Publisher: Cambridge University Press
Year: 2010
Tongue: English
Weight: 774 KB
Volume: 2
Category: Article
ISSN: 1759-0787
DOI: 10.1017/s1759078710000097

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