Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
โ Scribed by Ueda, Osamu; Pearton, Stephen J.
- Book ID
- 120359299
- Publisher
- Springer New York
- Year
- 2012
- Weight
- 783 KB
- Category
- Article
- ISBN
- 1461443377
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and