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Reliability Improvement of AlInAs/GaInAs High Electron Mobility Transistors by Fluorine Incorporation Control

✍ Scribed by Hayafuji, N.

Book ID: 125435975
Publisher: The Electrochemical Society
Year: 1998
Tongue: English
Weight: 366 KB
Volume: 145
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.1838742

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