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Reliability improvement of electronic circuits based on physical failure mechanisms in components

✍ Scribed by A. C. Brombacher; H. A. de Boer; M. Bennion; P. H. Fennema; O. E. Herrmann

Book ID: 112184649
Publisher: John Wiley and Sons
Year: 1991
Tongue: English
Weight: 828 KB
Volume: 7
Category: Article
ISSN: 0748-8017
DOI: 10.1002/qre.4680070412

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