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[IEEE 2013 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL (2013.1.28-2013.1.31)] 2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) - Integrated circuit reliability prediction based on physics-of-failure models in conjunction with field study

✍ Scribed by Hava, A.; Jin Qin, ; Bernstein, J. B.; Bot, Y.

Book ID: 120557744
Publisher: IEEE
Year: 2013
Weight: 626 KB
Category: Article
ISBN: 1467347108
DOI: 10.1109/RAMS.2013.6517737

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