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[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Improvement of ageing simulation of electronic circuits based on behavioural modelling

✍ Scribed by Marc, F.; Mongellaz, B.; Bestory, C.; Levi, H.; Danto, Y.

Book ID: 118257596
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 418 KB
Volume: 0
Category: Article
ISBN-13: 9780780393011
DOI: 10.1109/ipfa.2005.1469160

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