𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (7-11 July 2003)] Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 - Silicon VLSI trends - what else besides scaling CMOS to its limit?

✍ Scribed by Ning, T.H.

Book ID: 120177749
Publisher: IEEE
Year: 2003
Weight: 318 KB
Category: Article
ISBN-13: 9780780377226
DOI: 10.1109/IPFA.2003.1222710

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Expanded Papers from the 2003 IEEE Inter

Expanded Papers from the 2003 IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)

📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 150 KB

[IEEE 2012 19th IEEE International Sympo

[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Ultrafast submicron thermal characterization of integrated circuits

✍ Shakouri, Ali; Maize, Kerry; Jackson, Philip; Wang, Xi; Vermeersch, Bjorn; Yazaw 📂 Article 📅 2012 🏛 IEEE ⚖ 302 KB

[IEEE 2008 15th International Symposium

[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Trends in solar cell research

✍ Mertens, R. 📂 Article 📅 2008 🏛 IEEE ⚖ 731 KB

[IEEE 2012 19th IEEE International Sympo

[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Copper oxidation study by TEM

✍ Esa, Siti Rahmah; Yahya, Rosiyah; Hassan, Aziz; Omar, Ghazali 📂 Article 📅 2012 🏛 IEEE ⚖ 65 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Evaluating RF ESD protection design: An overview

✍ Guang Chen, ; Wang, A. 📂 Article 📅 2004 🏛 IEEE ⚖ 279 KB

[IEEE 2013 20th IEEE International Sympo

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - A novel analysis method of power signal for integrated circuits Trojan detection

✍ Li-wei Wang, ; Hai Xie, ; Hong-wei Luo, 📂 Article 📅 2013 🏛 IEEE ⚖ 760 KB