✦ LIBER ✦
Consideration of component failure mechanisms in the reliability assessment of electronic equipment— Addressing the constant failure rate assumption : DAVID E. MORTIN, JANE G. KROLEWSKI and MICHAEL J. CUSHING. Proceedings of the Annual IEEE Reliability and Maintainability Symposium, 54 (1995)
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 113 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.