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Reliability considerations of III-nitride microelectronic devices

✍ Scribed by Joachim Würfl; Vera Abrosimova; Jochen Hilsenbeck; Erich Nebauer; Walter Rieger; Günther Tränkle


Book ID
108362463
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
308 KB
Volume
39
Category
Article
ISSN
0026-2714

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