✦ LIBER ✦

Integration of efforts for the reliability of microelectronic devices

✍ Scribed by W. Gerling

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A fabrication method for the integration

✍ Zimmerman, S.M.; Babie, W.T. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 1017 KB

Reliability considerations of III-nitrid

✍ Joachim Würfl; Vera Abrosimova; Jochen Hilsenbeck; Erich Nebauer; Walter Rieger; 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 308 KB

A survey of reliability-prediction proce

✍ Bowles, J.B. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 1016 KB

Method of increasing the reliability of

✍ Yu. G. Karpov 📂 Article 📅 1975 🏛 Springer US 🌐 English ⚖ 563 KB

Special techniques for the Auger analysi

✍ M.S. Leung; G.W. Stupian 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 578 KB

Computation for Electromigration in Inte

✍ Amir Averbuch; Moshe Israeli; Igor Ravve; Irad Yavneh 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 679 KB