✦ LIBER ✦

A survey of reliability-prediction procedures for microelectronic devices

✍ Scribed by Bowles, J.B.

Book ID: 114555005
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 1016 KB
Volume: 41
Category: Article
ISSN: 0018-9529
DOI: 10.1109/24.126662

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A survey of reliability-prediction proce

A survey of reliability-prediction procedures for microelectronic devices : John B. Bowles. IEEE Trans. Reliab. 41, 2 (1992)

📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 137 KB

Integration of efforts for the reliabili

Integration of efforts for the reliability of microelectronic devices

✍ W. Gerling 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 739 KB

A survey of device reliability concerns

A survey of device reliability concerns for LV/LP IC technologies

✍ K.F. Galloway; R.D. Schrimpf 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 789 KB

This survey paper will discuss reliability considerations for low voltage/low power (LV/LP) integrated circuit technologies with a focus on device level issues. The growing LV/LP market will continue to be dominated by scaled CMOS. However, CMOS on SOI (silicon on insulator) may grow in importance d

A fabrication method for the integration

A fabrication method for the integration of vacuum microelectronic devices

✍ Zimmerman, S.M.; Babie, W.T. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 1017 KB

Model Pulses for Performance Prediction

Model Pulses for Performance Prediction of Digital Microelectronic Systems

✍ Lager, I. E.; de Hoop, A. T.; Kikkawa, T. 📂 Article 📅 2012 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 937 KB

Control of degradation processes in elec

Control of degradation processes in electronic devices and prediction of their reliability

✍ V. K. Aladinskii; A. R. Kasimov 📂 Article 📅 1998 🏛 Springer US 🌐 English ⚖ 273 KB