๐”– Bobbio Scriptorium
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A survey of reliability-prediction procedures for microelectronic devices

โœ Scribed by Bowles, J.B.


Book ID
114555005
Publisher
IEEE
Year
1992
Tongue
English
Weight
1016 KB
Volume
41
Category
Article
ISSN
0018-9529

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A survey of device reliability concerns
โœ K.F. Galloway; R.D. Schrimpf ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 789 KB

This survey paper will discuss reliability considerations for low voltage/low power (LV/LP) integrated circuit technologies with a focus on device level issues. The growing LV/LP market will continue to be dominated by scaled CMOS. However, CMOS on SOI (silicon on insulator) may grow in importance d