A survey of reliability-prediction procedures for microelectronic devices : John B. Bowles. IEEE Trans. Reliab. 41, 2 (1992)

• Book ID: 103285824
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 137 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90306-6