๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A survey of device reliability concerns for LV/LP IC technologies

โœ Scribed by K.F. Galloway; R.D. Schrimpf

Book ID
104306467
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
789 KB
Volume
39
Category
Article
ISSN
0167-9317

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โœฆ Synopsis

This survey paper will discuss reliability considerations for low voltage/low power (LV/LP) integrated circuit technologies with a focus on device level issues. The growing LV/LP market will continue to be dominated by scaled CMOS. However, CMOS on SOI (silicon on insulator) may grow in importance due to improved performance when compared to bulk, low power CMOS. Aggressive low voltage/ low power technologies may alter the relative importance of current reliability concerns. This survey will attempt to assess the effect of a LV/LP roadmap on device reliability.

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