Results of a 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, Part 2. Survey of dominant IC failure mechanisms and analysis of failure causes: A. P. Kemeny, G. Kalmar and V. Stefaniay. Microelectron. and Reliab.14, 499 (1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 250 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90393-0