Results of a 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, Part I. Test results and electrical failure analysis: A. P. Kemeny and G. Kalmar. Microelectron. and Reliab.14, 469 (1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 127 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90392-9