Relationship between electron sensitivity and chemical structures of polymers as electron beam resist. VII: Electron sensitivity of vinyl polymers containing pendant 1,3-dioxolan groups
β Scribed by Kiyoshi Oguchi; Kohei Sanui; Naoya Ogata; Yoichi Takahashi; Tomihiro Nakada
- Publisher
- Society for Plastic Engineers
- Year
- 1990
- Tongue
- English
- Weight
- 365 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0032-3888
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β¦ Synopsis
Abstract
Vinyl polymers containing pendant acetal groups were synthesized using (2,2βdimethylβl,3βdioxolanβ4βyl)methyl acrylate (DMA) and (2,2βdimethylβl,3βdioxoβlanβ4βyl)methyl methacrylate (DMM), and were evaluated as negative electron beam (EB) resists. It was found that the EB sensitivity of polymers containing acetal groups in the side chain was higher than that of polymers containing acetal groups in the main chain. A high sensitivity of 3.6 Γ 10^β8^ C/cm^2^ was observed. Copolymers of DMA or DMM with styrene were also synthesized in order to improve the durability for dry etching process. It was found that the copolymers had an excellent dry etching durability and were adaptable to EB lithography.
π SIMILAR VOLUMES
## Abstract Polyamides containing double bonds or epoxy groups were synthesized and evaluated as electron beam (EB) resists, in order to find the relationship between electron beam sensitivity and chemical structure of the polyamides. It was found that polyamides containing double bonds, which have