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Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors

✍ Scribed by Scofield, J.H.; Borland, N.; Fleetwood, D.M.


Book ID
114535916
Publisher
IEEE
Year
1994
Tongue
English
Weight
702 KB
Volume
41
Category
Article
ISSN
0018-9383

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