Influence of the interface and of the channel volume on 1/ƒ noise of MOS transistors biased in the linear region at strong inversion

✍ Scribed by Franciszek Grabowski

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 553 KB
• Volume: 31
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(88)90094-9