✦ LIBER ✦
Difference between the 1f noise spectral density before and after stress as a measure of the submicron MOS transistors degradation
✍ Scribed by Franciszek Grabowski
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 728 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0026-2714
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