Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion—Influence of interface states

✍ Scribed by Reimbold, G.

• Book ID: 114594842
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 944 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21687