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Recent studies of surface dynamic processes by reflection electron microscopy

✍ Scribed by Katsumichi Yagi; Akira Yamanaka; Itsuro Homma

Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
898 KB
Volume
20
Category
Article
ISSN
1059-910X

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✦ Synopsis

Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed adsorbate by co-deposition of metals on Si surface. The observations revealed details of the surface dynamic processes, which are difficult to obtain with other surface analysis techniques.

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