The diagnostic potential of reΓected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou
β¦ LIBER β¦
The surface reaction of Pd/MgO studied by scanning reflection electron microscopy
β Scribed by Ou, H.-J. ;Cowley, J. M.
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 887 KB
- Volume
- 107
- Category
- Article
- ISSN
- 0031-8965
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