Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed ads
β¦ LIBER β¦
Reflection electron microscopy studies of GaP(110) surfaces in UHV-TEM
β Scribed by M. Gajdardziska-Josifovska; M.R. McCartney; David J. Smith
- Publisher
- Elsevier Science
- Year
- 1993
- Weight
- 62 KB
- Volume
- 287-288
- Category
- Article
- ISSN
- 0167-2584
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