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Anomalous reflected images of objects on crystal surfaces in reflection electron microscopy

✍ Scribed by Kyozaburo Kambe

Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
471 KB
Volume
25
Category
Article
ISSN
0304-3991

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Two beam interferences produced using an electrostatic biprism, which is inserted in the position of the selected area diaphragm of a commercial electron microscope, may be used in reflection electron microscopy to determine the phase shifts induced by structures on single crystal surfaces. A descri