Two beam interferences produced using an electrostatic biprism, which is inserted in the position of the selected area diaphragm of a commercial electron microscope, may be used in reflection electron microscopy to determine the phase shifts induced by structures on single crystal surfaces. A descri
✦ LIBER ✦
Direct imaging of atomic steps in reflection electron microscopy
✍ Scribed by Y. Uchida; J. Jäger; G. Lehmpfuhl
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 257 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0304-3991
No coin nor oath required. For personal study only.
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