𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Atomic step imaging on silicon surfaces by scanning electron microscopy

✍ Scribed by Y. Homma; M. Tomita; T. Hayashi

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
949 KB
Volume
52
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Observation of atomic steps on single cr
Observation of atomic steps on single crystal surfaces by a commercial scanning electron microscope
✍ Yuji Uchida; Gisela Weinberg; Gunter Lehmpfuhl πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 621 KB

Atomic steps on ( ) and (100) crystal surfaces of Pt were observed using a commercial scanning electron microscope (SEMI in secondary electron mode. By comparing the SEM images and those by reflection electron microscopy (REM), the observed contrast was confirmed to be that from atomic steps on crys

Quality assessment of atomic force micro
Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images
✍ Taatjes, Douglas J.; Quinn, Anthony S.; Lewis, Michael R.; Bovill, Edwin G. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 855 KB

While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,