Two beam interferences produced using an electrostatic biprism, which is inserted in the position of the selected area diaphragm of a commercial electron microscope, may be used in reflection electron microscopy to determine the phase shifts induced by structures on single crystal surfaces. A descri
Observation of atomic steps on single crystal surfaces by a commercial scanning electron microscope
โ Scribed by Yuji Uchida; Gisela Weinberg; Gunter Lehmpfuhl
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 621 KB
- Volume
- 20
- Category
- Article
- ISSN
- 1059-910X
No coin nor oath required. For personal study only.
โฆ Synopsis
Atomic steps on ( ) and (100) crystal surfaces of Pt were observed using a commercial scanning electron microscope (SEMI in secondary electron mode. By comparing the SEM images and those by reflection electron microscopy (REM), the observed contrast was confirmed to be that from atomic steps on crystal surfaces. The contrast mechanism is briefly discussed. One application of this imaging technique is also shown.
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