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Degradation, amorphization, and recrystallization of ion bombarded si(111) surfaces studied by in situ reflection electron microscopy and reflection high energy electron diffraction techniques

✍ Scribed by A. Claverie; J. Beauvillain; J. Fauré; C. Vieu; B. Jouffrey


Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
865 KB
Volume
20
Category
Article
ISSN
1059-910X

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