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Surface imaging of III–V semiconductors by reflection electron microscopy and inner potential measurements

✍ Scribed by N. Yamamoto; J.C.H. Spence

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 879 KB
Volume: 104
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(83)90547-3

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