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Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

✍ Scribed by David J. Ellison; Bumsu Lee; V. Podzorov; C. Daniel Frisbie


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
824 KB
Volume
23
Category
Article
ISSN
0935-9648

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The local contact potential di †erence (CPD) of di †erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh