✦ LIBER ✦
Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices
✍ Scribed by A. Doukkali; S. Ledain; C. Guasch; J. Bonnet
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 232 KB
- Volume
- 235
- Category
- Article
- ISSN
- 0169-4332
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