𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Reflection electron microscopy of ultra fast surface processes

✍ Scribed by Heinricht, F.


Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
730 KB
Volume
116
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Recent studies of surface dynamic proces
✍ Katsumichi Yagi; Akira Yamanaka; Itsuro Homma πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 898 KB

Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed ads

Reflected Electron Energy-loss Microscop
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou