Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed ads
β¦ LIBER β¦
Reflection electron microscopy of ultra fast surface processes
β Scribed by Heinricht, F.
- Publisher
- John Wiley and Sons
- Year
- 1989
- Tongue
- English
- Weight
- 730 KB
- Volume
- 116
- Category
- Article
- ISSN
- 0031-8965
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