A Raman study of the strain in InP/GaAs
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S. Gennari; P.P. Lottici; F. RiccΓ²
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Article
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1995
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Elsevier Science
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English
β 145 KB
A Raman investigation on InP layers grown by Metal Organic Vapour Phase Epitaxy on GaAs (001) substrates, with thicknesses exceeding the critical thickness and ranging from 23 to \(280 \mathrm{~nm}\), is reported. The InP LO phonon shows an increasing frequency blueshift with decreasing layer thickn