Characterization of MOCVD-grown GaAs/strained layer superlattices/ GaP/Si heterostructures by transmission electron microscopy

✍ Scribed by O. Ueda; T. Soga; T. Jimbo; M. Umeno

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 795 KB
• Volume: 106
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(90)90020-l