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Radiation Induced Leakage Currents in Silicon on Sapphire MOS Transistors

✍ Scribed by Wang, S. T.; Royce, B. S. H.

Book ID: 117929879
Publisher: IEEE
Year: 1976
Tongue: English
Weight: 929 KB
Volume: 23
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1976.4328544

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