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Quantum chemical study of the properties of an SiO2/Si(100) interface implanted with boron ions

✍ Scribed by A. V. Tkachenko; O. Y. Ananina; A. S. Yanovsky

Book ID: 111501683
Publisher: Allerton Press Inc
Year: 2010
Tongue: English
Weight: 251 KB
Volume: 74
Category: Article
ISSN: 1062-8738
DOI: 10.3103/s1062873810020127

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