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Recovery of the Si–SiO2 interface studied by self-diffusion after high fluence ion implantation of 28Si

✍ Scribed by H. Karl; Ch. Delpero; P. Huber; B. Stritzker


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
126 KB
Volume
242
Category
Article
ISSN
0168-583X

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