Deep trapping of implanted Na+ and Li+ ions near the Si/SiO2 interface in metal-oxide-silicon structures : G. Greeuw and J. F. Verwey. Solid-St. Electron.28 (5) 509 (1985)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 132 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90194-0