✦ LIBER ✦

Proton-induced damage in JFET transistors and charge preamplifiers on high-resistivity silicon

✍ Scribed by Betta, G.F.D.; Manghisoni, M.; Ratti, L.; Re, V.; Speziali, V.; Traversi, G.; Candelori, A.

Book ID: 121253741
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 224 KB
Volume: 51
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2004.835063

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Proton radiation damage in p-channel CCD

Proton radiation damage in p-channel CCDs fabricated on high-resistivity silicon

✍ Bebek, C.; Groom, D.; Holland, S.; Karcher, A.; Kolbe, W.; Lee, J.; Levi, M.; Pa 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 215 KB

Comparison between high-energy proton an

Comparison between high-energy proton and charged pion induced damage in PbWO4 calorimeter crystals

✍ P. Lecomte; D. Luckey; F. Nessi-Tedaldi; F. Pauss; D. Renker 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 440 KB

Photo-induced millimeter wave losses in

Photo-induced millimeter wave losses in coplanar waveguide on high resistivity silicon

✍ G. Poesen; G. Koers; J. Stiens; G. Carchon; W. De Raedt; R. Vounckx 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 151 KB

## Abstract We report on a multifunctional optoelectronic radio frequency attenuator for millimeter wave applications, designed in a multilayer thin‐film multichip module technology on high resistive silicon. Insertion loss of measurements and electromagnetic simulations of a coplanar waveguide lin

Study of radiation damage induced by 12

Study of radiation damage induced by 12 keV X-rays in MOS structures built on high-resistivity n-type silicon

✍ Zhang, Jiaguo ;Pintilie, Ioana ;Fretwurst, Eckhart ;Klanner, Robert ;Perrey, Han 📂 Article 📅 2012 🏛 International Union of Crystallography 🌐 English ⚖ 918 KB

Latent damage investigation on lateral n

Latent damage investigation on lateral nonuniform charge generation and stress-induced leakage current in silicon dioxide subjected to high-field current impulse stressing

✍ Wai-Kim Chim; Peng-Soon Lim 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 230 KB

[American Vacuum Soc 1998 3rd Internatio

[American Vacuum Soc 1998 3rd International Symposium on Plasma Process-Induced Damage - Honolulu, HI, USA (4-5 June 1998)] 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100) - Effects of low energy light ions on notching and charging in high-density plasma [etching]

✍ Tabara, S. 📂 Article 📅 1998 🏛 American Vacuum Soc ⚖ 447 KB