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Proton radiation damage in p-channel CCDs fabricated on high-resistivity silicon

✍ Scribed by Bebek, C.; Groom, D.; Holland, S.; Karcher, A.; Kolbe, W.; Lee, J.; Levi, M.; Palaio, N.; Turko, B.; Uslenghi, M.; Wagner, A.; Wang, G.

Book ID: 121001175
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 215 KB
Volume: 49
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2002.1039641

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