✦ LIBER ✦
Latent damage investigation on lateral nonuniform charge generation and stress-induced leakage current in silicon dioxide subjected to high-field current impulse stressing
✍ Scribed by Wai-Kim Chim; Peng-Soon Lim
- Book ID
- 114538049
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 230 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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