## Abstract An improved pad‐deembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree
Proposal of a method for fitting parameters of an equivalent circuit for dielectrics
✍ Scribed by Igor Travěnec; Pavol Kalinay
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 137 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0167-2738
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