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A robust parameter extraction method for HBT small-signal equivalent circuit

✍ Scribed by Sung-Jin Ho; Min Ki Choi; Daniel W. van der Weide


Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
548 KB
Volume
49
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

An improved pad‐deembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agreement with the measured S‐parameters obtained from 45 MHz to 40 GHz for different sizes of HBTs. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 1845–1848, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22573


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